He Xiao
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 January 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Refractive index, Interferometry, Wavefronts, Optical testing, 3D metrology

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