He Xiao
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 January 2018 Paper
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Interferometry, Wavefronts, 3D metrology, Refractive index, Optical testing

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