Dr. Hee C. Lim
at New Jersey Institute of Technology
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | February 18, 2008
Proc. SPIE. 6884, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII
KEYWORDS: Capacitors, Silica, Sensors, Etching, Metals, Silicon, Silicon films, Low pressure chemical vapor deposition, Plasma enhanced chemical vapor deposition, Reactive ion etching

PROCEEDINGS ARTICLE | February 12, 2008
Proc. SPIE. 6886, Microfluidics, BioMEMS, and Medical Microsystems VI
KEYWORDS: Optical lithography, Capacitors, Silica, Sensors, Metals, Silicon, Finite element methods, Photomasks, Low pressure chemical vapor deposition, Plasma enhanced chemical vapor deposition

PROCEEDINGS ARTICLE | January 19, 2007
Proc. SPIE. 6463, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VI
KEYWORDS: Thin films, LabVIEW, Sensors, Nitrogen, Physics, Power supplies, Data acquisition, Relays, Oscilloscopes, Electronic circuits

SPIE Journal Paper | January 1, 2003
JBO Vol. 8 Issue 01
KEYWORDS: Skin, Reflectivity, Polarization, Tissue optics, Tissues, In vivo imaging, Reflection, Natural surfaces, Light scattering, Scattering

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