Dr. Hee C. Lim
at New Jersey Institute of Technology
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 18 February 2008 Paper
Sheng Liu, Reginald Farrow, James Zunino, Hee Lim, John Federici, Gordon Thomas
Proceedings Volume 6884, 68840I (2008) https://doi.org/10.1117/12.763740
KEYWORDS: Sensors, Silicon, Capacitors, Low pressure chemical vapor deposition, Metals, Plasma enhanced chemical vapor deposition, Silicon films, Reactive ion etching, Etching, Silica

Proceedings Article | 12 February 2008 Paper
Sheng Liu, Reginald Farrow, James Zunino, Hee Lim, John Federici, Gordon Thomas
Proceedings Volume 6886, 688606 (2008) https://doi.org/10.1117/12.763795
KEYWORDS: Sensors, Silicon, Capacitors, Low pressure chemical vapor deposition, Metals, Plasma enhanced chemical vapor deposition, Finite element methods, Optical lithography, Photomasks, Silica

Proceedings Article | 19 January 2007 Paper
Proceedings Volume 6463, 64630A (2007) https://doi.org/10.1117/12.704223
KEYWORDS: Sensors, Thin films, Oscilloscopes, Power supplies, Relays, Data acquisition, LabVIEW, Electronic circuits, Physics, Nitrogen

SPIE Journal Paper | 1 January 2003 Open Access
Nejat Guzelsu, John Federici, Hee Lim, Hans Chauhdry, Arthur Ritter, Tom Findley
JBO, Vol. 8, Issue 01, (January 2003) https://doi.org/10.1117/12.10.1117/1.1527936
KEYWORDS: Skin, Reflectivity, Polarization, Tissue optics, Tissues, In vivo imaging, Reflection, Natural surfaces, Light scattering, Scattering

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