Prof. Hei Wong
at City Univ of Hong Kong
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 23, 2005
Proc. SPIE. 5844, Noise in Devices and Circuits III
KEYWORDS: Oxides, Statistical analysis, Dielectrics, Resistance, Transistors, Field effect transistors, Molybdenum, Semiconducting wafers, Process modeling, Instrument modeling

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