Prof. Heidi Ottevaere
Professor at Vrije Univ Brussel
SPIE Involvement:
Conference Program Committee | Conference Chair | Author | Editor
Publications (90)

PROCEEDINGS ARTICLE | August 24, 2017
Proc. SPIE. 10377, Optical System Alignment, Tolerancing, and Verification XI
KEYWORDS: Raman spectroscopy, Reflectors, Confocal microscopy, Polymers, Signal detection, Spectroscopes, Lab on a chip, Optical simulations, Raman scattering, Point-of-care devices

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Point diffraction interferometers, Interferometers, Inspection, Diamond turning, Surface finishing, Interferometry, X-ray optics, Precision optics, Optical testing, Polishing, Wavefronts, Diffraction, Manufacturing, EUV optics

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9947, Current Developments in Lens Design and Optical Engineering XVII
KEYWORDS: Raman spectroscopy, Microfluidics, Optical tweezers, Raman scattering, Reflectors, Particles, Polymethylmethacrylate, Signal detection, Gaussian beams, Urea

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9971, Applications of Digital Image Processing XXXIX
KEYWORDS: Imaging systems, Multichannel imaging systems, Image sensors, Lenses, Channel projecting optics, Modulation transfer functions, Chromatic aberrations, Microlens array, Image resolution, Image quality

PROCEEDINGS ARTICLE | July 1, 2016
Proc. SPIE. 9888, Micro-Optics 2016
KEYWORDS: Raman spectroscopy, Confocal microscopy, Microfluidics, Spectroscopy, Polymers, Lab on a chip, Raman scattering, Polymethylmethacrylate, Urea, Bioalcohols, Optical fibers

PROCEEDINGS ARTICLE | April 29, 2016
Proc. SPIE. 9899, Optical Sensing and Detection IV
KEYWORDS: Photoelasticity, Fiber optics sensors, Glasses, Optical fibers, Fiber characterization, Sensors, Birefringence, Fourier theory, Algorithm development, Photoelasticity, Algorithms, Cladding, Silica, Multimode fibers, Telecommunications

Showing 5 of 90 publications
Conference Committee Involvement (7)
Optical Micro- and Nanometrology
22 April 2018 | Strasbourg, France
Optical Micro- and Nanometrology
5 April 2016 | Brussels, Belgium
Optical Micro- and Nanometrology
15 April 2014 | Brussels, Belgium
Optical Micro- and Nanometrology
16 April 2012 | Brussels, Belgium
Optical Micro- and Nanometrology
13 April 2010 | Brussels, Belgium
Showing 5 of 7 published special sections
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