Prof. Heidi Ottevaere
Professor at Vrije Universiteit Brussel
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (90)

PROCEEDINGS ARTICLE | August 24, 2017
Proc. SPIE. 10377, Optical System Alignment, Tolerancing, and Verification XI
KEYWORDS: Confocal microscopy, Reflectors, Point-of-care devices, Polymers, Raman spectroscopy, Lab on a chip, Optical simulations, Raman scattering, Signal detection, Spectroscopes

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Diffraction, Diamond turning, X-ray optics, Polishing, Point diffraction interferometers, Interferometers, Manufacturing, Inspection, Interferometry, Wavefronts, Optical testing, Precision optics, Surface finishing, EUV optics

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9947, Current Developments in Lens Design and Optical Engineering XVII
KEYWORDS: Reflectors, Microfluidics, Gaussian beams, Polymethylmethacrylate, Particles, Raman spectroscopy, Optical tweezers, Raman scattering, Signal detection, Urea

PROCEEDINGS ARTICLE | September 27, 2016
Proc. SPIE. 9971, Applications of Digital Image Processing XXXIX
KEYWORDS: Chromatic aberrations, Microlens array, Imaging systems, Lenses, Image resolution, Image quality, Image sensors, Modulation transfer functions, Multichannel imaging systems, Channel projecting optics

PROCEEDINGS ARTICLE | July 1, 2016
Proc. SPIE. 9888, Micro-Optics 2016
KEYWORDS: Confocal microscopy, Optical fibers, Microfluidics, Polymethylmethacrylate, Polymers, Spectroscopy, Bioalcohols, Raman spectroscopy, Lab on a chip, Raman scattering, Urea

PROCEEDINGS ARTICLE | April 29, 2016
Proc. SPIE. 9899, Optical Sensing and Detection IV
KEYWORDS: Multimode fibers, Optical fibers, Photoelasticity, Photoelasticity, Silica, Birefringence, Cladding, Sensors, Glasses, Fiber optics sensors, Telecommunications, Algorithm development, Fiber characterization, Fourier theory, Algorithms

Showing 5 of 90 publications
Conference Committee Involvement (7)
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
Optical Micro- and Nanometrology
5 April 2016 | Brussels, Belgium
Optical Micro- and Nanometrology
15 April 2014 | Brussels, Belgium
Optical Micro- and Nanometrology
16 April 2012 | Brussels, Belgium
Optical Micro- and Nanometrology
13 April 2010 | Brussels, Belgium
Showing 5 of 7 published special sections
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