Prof. Heinz Hügli
Honorary professor at Univ of Neuchâtel
SPIE Involvement:
Author
Publications (23)

Proceedings Article | 29 August 2008
Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI
KEYWORDS: Microscopes, Safety, Imaging systems, Cameras, Sensors, Inspection, Clouds, Range imaging, Time of flight cameras, 3D image processing

Proceedings Article | 25 April 2008
Proc. SPIE. 7000, Optical and Digital Image Processing
KEYWORDS: Microlens array, Defect detection, Lenses, Databases, Metals, Image segmentation, Image processing, Coating, Inspection, Microlens

Proceedings Article | 4 March 2008
Proc. SPIE. 6806, Human Vision and Electronic Imaging XIII
KEYWORDS: Eye, Visual process modeling, Visualization, Cameras, Video, Computer simulations, Motion models, Performance modeling, Eye models, RGB color model

Proceedings Article | 10 October 2007
Proc. SPIE. 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V
KEYWORDS: Point spread functions, Scattering, Cameras, Image processing, Light scattering, Time of flight cameras, Image filtering, Deconvolution, Electronic filtering, Scattering compensation

Proceedings Article | 16 February 2007
Proc. SPIE. 6492, Human Vision and Electronic Imaging XII
KEYWORDS: Eye, Human subjects, Visual process modeling, Visualization, Video, Computer simulations, Motion models, Performance modeling, Eye models, RGB color model

Showing 5 of 23 publications
Proceedings Volume Editor (1)

Conference Committee Involvement (8)
Optical Inspection and Metrology for Non-Optics Industries
3 August 2009 | San Diego, California, United States
Two- and Three-Dimensional Methods for Inspection and Metrology VI
10 August 2008 | San Diego, California, United States
Two- and Three-Dimensional Methods for Inspection and Metrology V
12 September 2007 | Boston, MA, United States
Two- and Three-Dimensional Methods for Inspection and Metrology IV
1 October 2006 | Boston, Massachusetts, United States
Two- and Three-Dimensional Methods for Inspection and Metrology III
25 October 2005 | Boston, MA, United States
Showing 5 of 8 Conference Committees
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