Hemanth K. N. Reddy
at Uppsala Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2019 Presentation + Paper
Proceedings Volume 11112, 111120T (2019) https://doi.org/10.1117/12.2531165
KEYWORDS: X-rays, Microscopes, X-ray microscopy, X-ray imaging, X-ray sources, Reliability, Zone plates, Image resolution

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