Hemanth K. N. Reddy
at Uppsala Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 9 September 2019
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Microscopes, X-rays, X-ray sources, X-ray microscopy, Reliability, Image resolution, Zone plates, X-ray imaging

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