Dr. Hendrik F. Hamann
Senior Manager for Physical Analytics at IBM Thomas J Watson Research Ctr
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | February 23, 2012
Proc. SPIE. 8261, Terahertz Technology and Applications V
KEYWORDS: Bolometers, Thermography, Infrared sensors, Silica, Resistance, Platinum, Black bodies, Infrared radiation, Semiconducting wafers, Nanowires

PROCEEDINGS ARTICLE | May 9, 2005
Proc. SPIE. 5766, Testing, Reliability, and Application of Micro- and Nano-Material Systems III
KEYWORDS: Microscopes, Optical spheres, Data modeling, Scattering, Light scattering, Atomic force microscopy, Near field scanning optical microscopy, Near field, Picosecond phenomena, Signal detection

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