Prof. Henning Heuer Profile

Prof. Henning Heuer

Working Group Manager Sensor Systems at Fraunhofer IKTS-MD

SPIE Involvement:

Author

Proceedings Article | 27 March 2015 Paper

Eddy current imaging for electrical characterization of silicon solar cells and TCO layers

Henning Heuer, Byungguk Hwang, Susanne Hillmann, Martin Schulze, Marcus Klein

Proceedings Volume 9439, 94390D (2015) https://doi.org/10.1117/12.2085302

KEYWORDS: Solar cells, Transparent conductors, Inspection, Electroluminescence, Silicon solar cells, Resistance, Silicon, Semiconducting wafers, Photovoltaics, Copper

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Proceedings Article | 17 May 2013 Paper

Counting x-ray line detector with monolithically integrated readout circuits

T. Lohse, P. Krüger, H. Heuer, M. Oppermann, H. Torlee, N. Meyendorf

Proceedings Volume 8763, 87632Q (2013) https://doi.org/10.1117/12.2017384

KEYWORDS: Sensors, X-rays, X-ray detectors, Gallium arsenide, Photons, Absorption, Electrodes, Readout integrated circuits, Integrated circuits, Integrated circuit design

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Proceedings Article | 17 May 2013 Paper

Design and fabrication of a 5 MHz ultrasonic phased array probe with curved transducer

Julia Fischer, Thomas Herzog, Susan Walter, Henning Heuer

Proceedings Volume 8763, 87632M (2013) https://doi.org/10.1117/12.2017004

KEYWORDS: Composites, Transducers, Ferroelectric materials, Epoxies, Ultrasonics, Phased arrays, Acoustics, Manufacturing, Ceramics, Chemical elements

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Proceedings Article | 5 April 2012 Paper

Textural analyses of carbon fiber materials by 2D-FFT of complex images obtained by high frequency eddy current imaging (HF-ECI)

Henning Heuer, Martin Schulze

Proceedings Volume 8347, 83470S (2012) https://doi.org/10.1117/12.914832

KEYWORDS: Carbon, Sensors, Inspection, Nondestructive evaluation, Polymers, Image filtering, Image processing, Visualization, Algorithm development, Linear filtering

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Proceedings Article | 5 May 2011 Paper

Smart ultrasonic sensors systems: investigations on aluminum nitride thin films for the excitation of high frequency ultrasound

Thomas Herzog, Henning Heuer, Hagen Bartzsch, Susan Walter, Daniel Gloess

Proceedings Volume 8066, 806607 (2011) https://doi.org/10.1117/12.886852

KEYWORDS: Sensors, Aluminum nitride, Electrodes, Thin films, Ultrasonography, Sputter deposition, Silicon, Ultrasonics, Phased arrays, Transducers

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Proceedings Article | 9 April 2010 Paper

Subsurface material characterization using high frequency eddy current spectroscopy

Norbert Meyendorf, Henning Heuer, Marcus Klein, Susanne Hillmann

Proceedings Volume 7648, 76480X (2010) https://doi.org/10.1117/12.848744

KEYWORDS: Thin films, Sensors, Copper, Magnetism, Reflection, Silicon films, Semiconductors, Semiconducting wafers, Spectroscopy, Material characterization

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Proceedings Article | 9 April 2010 Paper

Analysis techniques for eddy current imaging of carbon fiber materials

Henning Heuer, Martin Schulze, Norbert Meyendorf

Proceedings Volume 7649, 76490G (2010) https://doi.org/10.1117/12.848741

KEYWORDS: Sensors, Carbon, Image sensors, Image filtering, Inspection, Linear filtering, Digital image processing, Metals, Image processing, Image analysis

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Proceedings Article | 19 May 2009 Paper

High-resolution eddy current sensor system

Martin Schulze, Martin Küttner, Henning Heuer

Proceedings Volume 7362, 73621A (2009) https://doi.org/10.1117/12.821443

KEYWORDS: Sensors, Carbon, Inspection, Photography, Metals, Defect detection, Prototyping, Phase shifts, Image processing, Magnetism

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Proceedings Article | 7 April 2009 Paper

High frequency eddy current device for near surface material characterizations

H. Heuer, S. Hillmann, N. Meyendorf

Proceedings Volume 7293, 72930S (2009) https://doi.org/10.1117/12.815455

KEYWORDS: Copper, Aluminum, Titanium, Statistical analysis, Solids, Material characterization, Nondestructive evaluation, Process control, Prototyping, Surface finishing

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Proceedings Article | 4 April 2006 Paper

Determination of deformation fields by atomic force acoustic microscopy

Ute Rabe, Bernd Köhler, André Striegler, Henning Heuer, Beatrice Bendjus

Proceedings Volume 6175, 617509 (2006) https://doi.org/10.1117/12.659016

KEYWORDS: Atomic force microscopy, Ultrasonics, Acoustics, Microscopy, Transducers, Sensors, Surface finishing, Ultrasonography, Silicon, Image sensors

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Showing 5 of 10 publications

Conference Committee Involvement (2)

Smart Sensors, Actuators, and MEMS VII

4 May 2015 | Barcelona, Spain

Smart Sensors, Actuators, and MEMS VI

24 April 2013 | Grenoble, France

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