Prof. Henry C. Kapteyn
Professor at JILA
SPIE Involvement:
Author
Publications (36)

PROCEEDINGS ARTICLE | May 8, 2017
Proc. SPIE. 10193, Ultrafast Bandgap Photonics II
KEYWORDS: Ultrafast phenomena, Scattering, Copper, Nickel, Electrons, Physics, Photonics, Solids, Extreme ultraviolet, Photoemission spectroscopy

PROCEEDINGS ARTICLE | March 28, 2017
Proc. SPIE. 10145, Metrology, Inspection, and Process Control for Microlithography XXXI
KEYWORDS: Microscopes, Diffraction, Mirrors, Detection and tracking algorithms, Sensors, Image resolution, Image transmission, Extreme ultraviolet, Reconstruction algorithms, Spatial resolution

PROCEEDINGS ARTICLE | September 30, 2016
Proc. SPIE. 9948, Novel Optical Systems Design and Optimization XIX
KEYWORDS: Microscopes, Diffraction, Coherence imaging, Imaging systems, Sensors, X-rays, Image resolution, Data acquisition, Extreme ultraviolet, X-ray imaging

PROCEEDINGS ARTICLE | May 13, 2016
Proc. SPIE. 9835, Ultrafast Bandgap Photonics
KEYWORDS: Coherence imaging, Curium, Polarization, X-rays, X-ray diffraction, X-ray microscopy, Magnetism, Extreme ultraviolet, Geometrical optics, X-ray imaging

PROCEEDINGS ARTICLE | April 21, 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Coherence imaging, Mirrors, Spectroscopy, Microscopy, Interfaces, Imaging spectroscopy, Extreme ultraviolet, High harmonic generation, Overlay metrology

PROCEEDINGS ARTICLE | April 21, 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Coherence imaging, Metrology, Polarization, Spatial filters, Spectroscopy, Wave propagation, Deconvolution, Reconstruction algorithms, Laser beam diagnostics, Diffraction gratings

Showing 5 of 36 publications
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