Dr. Hidekazu Mimura
Associate Professor at Univ of Tokyo
SPIE Involvement:
Conference Chair | Conference Program Committee | Author
Publications (39)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Mirrors, X-rays, Data analysis, Metrology

PROCEEDINGS ARTICLE | September 6, 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Mirrors, X-rays, Free electron lasers, Optical design, X-ray lasers, Light sources, Diffraction, Extreme ultraviolet, Light-matter interactions, Coating

PROCEEDINGS ARTICLE | October 25, 2016
Proc. SPIE. 9687, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
KEYWORDS: Mirrors, X-ray microscopy, Magnetorheological finishing, Phase retrieval, Wavefronts, Microscopes, Nickel, Spatial frequencies, X-rays, Objectives

PROCEEDINGS ARTICLE | September 20, 2016
Proc. SPIE. 9982, Unconventional Imaging and Wavefront Sensing XII
KEYWORDS: Wavefronts, Phase retrieval, Diffraction, Optical testing, Helium neon lasers, Spiral phase plates, CCD cameras, Spatial light modulators, Holograms, Charge-coupled devices

PROCEEDINGS ARTICLE | September 15, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Mirrors, Profilometers, X-rays, Motion measurement, X-ray optics, EUV optics, Sensors, Spatial resolution, Nickel, Quartz

PROCEEDINGS ARTICLE | October 12, 2015
Proc. SPIE. 9633, Optifab 2015
KEYWORDS: Mirrors, Wavefronts, Phase retrieval, Charge-coupled devices, Transmittance, CCD cameras, X-rays, Monochromatic aberrations, Laser development, X-ray characterization

Showing 5 of 39 publications
Conference Committee Involvement (8)
Advances in X-Ray/EUV Optics and Components XIII
19 August 2018 | San Diego, California, United States
Adaptive X-Ray Optics V
19 August 2018 | San Diego, California, United States
Advances in X-Ray/EUV Optics and Components XII
8 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Showing 5 of 8 published special sections
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