Hidemitsu Toba
at Nikon Corp
SPIE Involvement:
Author
Publications (3)

SPIE Journal Paper | 13 August 2019
OE Vol. 58 Issue 08
KEYWORDS: Error analysis, Fourier transforms, Fringe analysis, Zernike polynomials, Linear filtering, Interferometers, Optical engineering, Optical filters, Phase measurement, Analytical research

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Diffraction, Digital holography, Scattering, Interferometers, Sensors, Denoising, Interferometry, Phase interferometry, Profiling, Phase measurement

Proceedings Article | 17 June 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Optical filters, Fringe analysis, Phase shifting, Interferometers, Error analysis, Fourier transforms, Interferometry, Linear filtering, Zernike polynomials, Phase measurement

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