Prof. Hideo Kobayashi
at Tokyo Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 July 2004 Paper
Proceedings Volume 5393, (2004) https://doi.org/10.1117/12.539091
KEYWORDS: Electrodes, Finite element methods, Resistance, Error analysis, Silver, Aerospace engineering, Reliability, Composites, Inverse problems, Visualization

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