Hideto Kameshima
at Keio Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 February 2008
Proc. SPIE. 6805, Three-Dimensional Image Capture and Applications 2008
KEYWORDS: Imaging systems, Cameras, Calibration, Distortion, Clouds, Image registration, Data acquisition, Time metrology, 3D metrology, 3D image processing

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