Mr. Hilbert Shen
at
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Publications (1)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5472, Noise and Information in Nanoelectronics, Sensors, and Standards II
KEYWORDS: Thermography, Signal to noise ratio, Infrared sensors, Sensors, Silicon, Interference (communication), Infrared radiation, Sensing systems, Stochastic processes, Temperature metrology

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