Hiroaki Ono
at JFE Steel Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 September 2016 Presentation + Paper
Hiroaki Ono, Akihiro Ogawa, Takahiro Yamasaki, Takahiro Koshihara, Toshifumi Kodama, Yukinori Iizuka, Takahiko Oshige
Proceedings Volume 9961, 99610I (2016) https://doi.org/10.1117/12.2236437
KEYWORDS: Inspection, Optical inspection, Defect detection, Image processing, Cameras, Reflection, Optical filters, Prototyping, Signal detection, Polarization

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