Hiroki Nishimura
at Nigata Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 February 2010
Proc. SPIE. 7597, Physics and Simulation of Optoelectronic Devices XVIII
KEYWORDS: Refractive index, Fabry–Perot interferometers, Sensors, Interference (communication), Semiconductor lasers, Frequency modulation, Fermium, Laser damage threshold, Binary data, Computer security

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