Dr. Hiromi Okada
at JTEC Corp
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | November 2, 2016
Proc. SPIE. 9962, Advances in Metrology for X-Ray and EUV Optics VI
KEYWORDS: Mirrors, X-ray optics, Metrology, X-rays, Multispectral imaging, Synchrotrons, EUV optics, Current controlled current source

PROCEEDINGS ARTICLE | September 17, 2015
Proc. SPIE. 9592, X-Ray Nanoimaging: Instruments and Methods II
KEYWORDS: Microscopes, Mirrors, Stars, Imaging systems, Cameras, X-rays, X-ray microscopy, Spatial resolution, X-ray imaging, Hard x-rays

PROCEEDINGS ARTICLE | October 1, 2007
Proc. SPIE. 6704, Advances in Metrology for X-Ray and EUV Optics II
KEYWORDS: Actuators, Mirrors, Interferometers, X-rays, Photography, Multispectral imaging, Head, Synchrotron radiation, Neodymium, Fizeau interferometers

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