Hiroshi Hatakeyama
at NEC Corp
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 7, 2009
Proc. SPIE. 7229, Vertical-Cavity Surface-Emitting Lasers XIII
KEYWORDS: Accelerated life testing, Oxides, Indium gallium arsenide, Quantum wells, Modulation, Reliability, Electroluminescence, Vertical cavity surface emitting lasers, Optical interconnects, Failure analysis

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