Dr. Hiroshi Ishida
Research Assistant at Tokyo Institute of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 14, 2002
Proc. SPIE. 4935, Smart Structures, Devices, and Systems
KEYWORDS: Semiconductors, Environmental monitoring, Gas sensors, Sensors, Error analysis, Sensing systems, Chemical analysis, Scanning probe microscopy, Atmospheric sensing, Atmospheric monitoring

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