Dr. Hiroshi Ohno
Research Scientist at Toshiba Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 September 2018
Proc. SPIE. 10726, Nanoimaging and Nanospectroscopy VI
KEYWORDS: Finite-difference time-domain method, Modulation, Reflectivity, Ultrasonics, Numerical analysis, Reconstruction algorithms, Picosecond phenomena, Acoustics, Laser beam diagnostics, Pulsed laser operation

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