Prof. Hiroshi Tanigawa
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 March 2024 Poster + Paper
Proceedings Volume 12906, 129060R (2024) https://doi.org/10.1117/12.3002014
KEYWORDS: Distance measurement, Image sensors, Inspection, Reflection, Industrial applications, Measurement devices, Light sources, Charge-coupled devices, Phase measurement, LIDAR

Proceedings Article | 5 September 2018 Presentation + Paper
T. Nishino, H. Tanigawa, A. Sekiguchi
Proceedings Volume 10728, 1072804 (2018) https://doi.org/10.1117/12.2320471
KEYWORDS: Silicon, Metamaterials, Nanolithography, Biomimetics, Nanoimprint lithography, Microscopes, Silicon films, Nanostructures, Nanotechnology, Thin films

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top