Hisatoshi Fujiwara
Engineer at Yamatake Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 18 October 2002
Proc. SPIE. 4902, Optomechatronic Systems III
KEYWORDS: Light sources, Moire patterns, Phase shifting, Reflection, Spatial frequencies, Image sensors, Charge-coupled devices, Spatial resolution, Camera shutters, Diffraction gratings

Proceedings Article | 4 October 2001
Proc. SPIE. 4564, Optomechatronic Systems II
KEYWORDS: Mirrors, Moire patterns, Phase shifting, Reflection, Glasses, Ultraviolet radiation, Error analysis, Time metrology, LCDs, Prototyping

Proceedings Article | 30 June 1998
Proc. SPIE. 3478, Laser Interferometry IX: Techniques and Analysis
KEYWORDS: Optical components, Moire patterns, Phase shifting, Glasses, Ultraviolet radiation, Ceramics, Time metrology, LCDs, Phase measurement, Semiconducting wafers

Proceedings Article | 4 November 1996
Proc. SPIE. 2862, Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
KEYWORDS: Light sources, Moire patterns, Phase shifting, Silica, Reflection, Lenses, Glasses, Ultraviolet radiation, LCDs, Semiconducting wafers

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