Holger B. H. Blaschke
at JENOPTIK Optical Systems GmbH
SPIE Involvement:
Publications (38)

Proceedings Article | 6 December 2011 Paper
Proceedings Volume 8190, 819007 (2011) https://doi.org/10.1117/12.899187
KEYWORDS: Mirrors, Laser induced damage, Resistance, Excimer lasers, Deposition processes, Excimers, Laser damage threshold, Silica, Ultraviolet radiation, Thin films

Proceedings Article | 28 November 2011 Paper
Proceedings Volume 8190, 81901T (2011) https://doi.org/10.1117/12.900042
KEYWORDS: Absorption, Silica, Surface finishing, Extreme ultraviolet, Polishing, Lithography, Deep ultraviolet, Spectroscopy, Temperature metrology, Quartz

Proceedings Article | 23 November 2011 Paper
Proceedings Volume 8190, 81900D (2011) https://doi.org/10.1117/12.899113
KEYWORDS: Silica, Oxides, Laser induced damage, Ultraviolet radiation, Laser damage threshold, Thin films, Data modeling, Thin film coatings, Ion beams, Data acquisition

Proceedings Article | 4 October 2011 Paper
Mathias Mende, Lars Jensen, Henrik Ehlers, Werner Riggers, Holger Blaschke, Detlev Ristau
Proceedings Volume 8168, 816821 (2011) https://doi.org/10.1117/12.897049
KEYWORDS: Reflectors, Silica, Multilayers, Refractive index, Absorption, Laser induced damage, Transmission electron microscopy, Ion beams, Hybrid fiber optics, Optical coatings

Proceedings Article | 8 April 2011 Paper
I. Balasa, H. Blaschke, D. Ristau
Proceedings Volume 7969, 796928 (2011) https://doi.org/10.1117/12.881577
KEYWORDS: Reflectivity, Spectral resolution, Spectrographs, Mirrors, Extreme ultraviolet, CCD cameras, Silicon, Optical components, Spectroscopy, Spectrophotometry

Showing 5 of 38 publications
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