Dr. Hong-hui Jia
at National Univ of Defense Technology
SPIE Involvement:
Author
Publications (14)

PROCEEDINGS ARTICLE | October 15, 2015
Proc. SPIE. 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
KEYWORDS: Optical design, Finite-difference time-domain method, Silica, Waveguides, Etching, Ultraviolet radiation, Silicon, Signal processing, Optical communications, Photonic integrated circuits

PROCEEDINGS ARTICLE | August 21, 2014
Proc. SPIE. 9233, International Symposium on Photonics and Optoelectronics 2014
KEYWORDS: Transmitters, Refractive index, Polarization, Modulators, Telecommunications, Optical communications, Free space optics, Defense technologies, Data communications, Free space optical communications

PROCEEDINGS ARTICLE | October 19, 2012
Proc. SPIE. 8540, Unmanned/Unattended Sensors and Sensor Networks IX
KEYWORDS: Modulation, Polarization, Scattering, Sensors, Ultraviolet radiation, Photons, Telecommunications, Data communications, Signal detection, Atmospheric particles

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Target detection, Signal to noise ratio, Sensors, Ultraviolet radiation, Missiles, Signal detection, Atmospheric sensing, Ultraviolet detectors, Atmospheric particles, Atmospheric modeling

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Hyperspectral imaging, Detection and tracking algorithms, Spectroscopy, Reflectivity, Computer programming, Atmospheric corrections, Spectral resolution, Image classification, Target recognition, Binary data

PROCEEDINGS ARTICLE | November 29, 2011
Proc. SPIE. 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology
KEYWORDS: Diffraction, Optical design, Switches, Switching, Titanium dioxide, Silica, Etching, Optical switching, Binary data, Diffraction gratings

Showing 5 of 14 publications
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