Honglei Chen
at Shanghai Institute of Technical Physics CAS
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 28 April 2017
Proc. SPIE. 10213, Hyperspectral Imaging Sensors: Innovative Applications and Sensor Standards 2017
KEYWORDS: Staring arrays, Readout integrated circuits, Infrared detectors, Signal to noise ratio, Hyperspectral imaging, Short wave infrared radiation, Mercury cadmium telluride, Imaging systems, Sensors, Silicon, Quantum efficiency, Interference (communication), Diodes, Spectral resolution

Proceedings Article | 15 October 2015
Proc. SPIE. 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
KEYWORDS: Readout integrated circuits, Signal to noise ratio, Digital signal processing, Capacitors, Interference (communication), Capacitance, Signal processing, High dynamic range imaging, Analog electronics, Digital electronics

Proceedings Article | 15 October 2015
Proc. SPIE. 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
KEYWORDS: Readout integrated circuits, Mid-IR, Capacitors, Sensors, Amplifiers, Signal processing, Analog electronics, Medium wave, Signal detection, Integrated circuit design

Proceedings Article | 15 October 2015
Proc. SPIE. 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
KEYWORDS: Readout integrated circuits, Infrared detectors, Thermography, Infrared imaging, Sensors, Indium, Reliability, Infrared radiation, Infrared technology, Failure analysis

Proceedings Article | 11 November 2014
Proc. SPIE. 9275, Infrared, Millimeter-Wave, and Terahertz Technologies III
KEYWORDS: Readout integrated circuits, Switches, Capacitors, Sensors, Amplifiers, Signal processing, Transistors, Medium wave, Digital electronics, Device simulation

Proceedings Article | 11 September 2013
Proc. SPIE. 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
KEYWORDS: Staring arrays, Readout integrated circuits, Signal to noise ratio, Capacitors, Modulation, Sensors, Resistance, Amplifiers, Infrared radiation, Device simulation

Showing 5 of 12 publications
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