Dr. Hongnian Feng
at China Jiliang Univ
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | June 9, 2006
Proc. SPIE. 6149, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Near infrared, Statistical analysis, Data modeling, Manufacturing, Inspection, Image classification, Near infrared spectroscopy, Binary data, Scalable video coding, Library classification systems

PROCEEDINGS ARTICLE | February 23, 2006
Proc. SPIE. 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Mathematical modeling, Near infrared, Statistical analysis, Data modeling, Calibration, Error analysis, Neural networks, Mathematics, Chemical analysis, Statistical modeling

PROCEEDINGS ARTICLE | February 2, 2006
Proc. SPIE. 6031, ICO20: Remote Sensing and Infrared Devices and Systems
KEYWORDS: Near infrared, Statistical analysis, Calibration, Spectroscopy, Error analysis, Molecules, Quantitative analysis, Chemical analysis, Near infrared spectroscopy, Absorption

PROCEEDINGS ARTICLE | January 12, 2005
Proc. SPIE. 5632, Light-Emitting Diode Materials and Devices
KEYWORDS: Light sources, Light emitting diodes, Sun, Lamps, Power supplies, Optoelectronics, Photosynthesis, Light, Blue light emitting diodes, Absorption

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