Prof. Hongwei Guo
at Shanghai Univ
SPIE Involvement:
Author
Publications (22)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Fringe analysis, Metrology, Opto mechatronics, Calibration, 3D metrology, Projection systems, Phase measurement

PROCEEDINGS ARTICLE | February 28, 2017
Proc. SPIE. 10256, Second International Conference on Photonics and Optical Engineering

PROCEEDINGS ARTICLE | June 1, 2016
Proc. SPIE. 9867, Three-Dimensional Imaging, Visualization, and Display 2016
KEYWORDS: Fringe analysis, Phase shifting, Spatial frequencies, Error analysis, Fourier transforms, Interferometry, Phase shift keying, Numerical integration, Computer simulations, Optical testing, Phase retrieval, Phase measurement, Algorithm development, Phase shifts

SPIE Journal Paper | August 13, 2015
OE Vol. 54 Issue 08
KEYWORDS: Cameras, Fringe analysis, Calibration, Volume rendering, Imaging systems, 3D image reconstruction, Projection systems, Phase shifts, 3D image processing, Phase shift keying

PROCEEDINGS ARTICLE | October 3, 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: Fringe analysis, Imaging systems, Calibration, Computer simulations, Clouds, CCD cameras, 3D metrology, Projection systems, Digital Light Processing, Phase shifts

PROCEEDINGS ARTICLE | November 28, 2007
Proc. SPIE. 6834, Optical Design and Testing III
KEYWORDS: Light sources, Fringe analysis, Imaging systems, Calibration, Silicon, 3D modeling, LCDs, Phase measurement, Phase shifts, Structured light

Showing 5 of 22 publications
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