Prof. Hongwei Guo
at Shanghai Univ
SPIE Involvement:
Author
Publications (22)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Calibration, 3D metrology, Projection systems, Metrology, Phase measurement, Fringe analysis, Opto mechatronics

PROCEEDINGS ARTICLE | February 28, 2017
Proc. SPIE. 10256, Second International Conference on Photonics and Optical Engineering

PROCEEDINGS ARTICLE | June 1, 2016
Proc. SPIE. 9867, Three-Dimensional Imaging, Visualization, and Display 2016
KEYWORDS: Fringe analysis, Algorithm development, Fourier transforms, Phase retrieval, Phase measurement, Optical testing, Interferometry, Spatial frequencies, Phase shifting, Phase shifts, Error analysis, Phase shift keying, Numerical integration, Computer simulations

SPIE Journal Paper | August 13, 2015
OE Vol. 54 Issue 08
KEYWORDS: Cameras, Fringe analysis, Calibration, Volume rendering, Imaging systems, 3D image reconstruction, Projection systems, Phase shifts, 3D image processing, Phase shift keying

PROCEEDINGS ARTICLE | October 3, 2008
Proc. SPIE. 7155, Ninth International Symposium on Laser Metrology
KEYWORDS: 3D metrology, Calibration, Fringe analysis, Computer simulations, CCD cameras, Imaging systems, Clouds, Digital Light Processing, Projection systems, Phase shifts

PROCEEDINGS ARTICLE | November 28, 2007
Proc. SPIE. 6834, Optical Design and Testing III
KEYWORDS: LCDs, Light sources, Fringe analysis, Silicon, Phase measurement, Phase shifts, Imaging systems, Calibration, 3D modeling, Structured light

Showing 5 of 22 publications
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