Hongwei Zhang
Associate Research Scientist
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 29 August 2016
Proc. SPIE. 10033, Eighth International Conference on Digital Image Processing (ICDIP 2016)
KEYWORDS: Hyperspectral imaging, Imaging systems, Calibration, Spectroscopy, Remote sensing, Reflectivity, Feature extraction, Vegetation, Spatial resolution, Data conversion

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Fringe analysis, Cameras, Optical testing, CCD cameras, Deflectometry, LCDs, 3D metrology, Reconstruction algorithms, Phase measurement, Phase shifts

Proceedings Article | 28 December 2010
Proc. SPIE. 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Optical components, Prisms, Beam splitters, Lasers, Calibration, Image processing, Optical testing, CCD cameras, Charge-coupled devices, Chemical elements

Proceedings Article | 10 September 2009
Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries
KEYWORDS: Mirrors, Sensors, Calibration, Manufacturing, Reliability, Inspection, Head, Distance measurement, Picosecond phenomena, Motion measurement

Proceedings Article | 9 January 2008
Proc. SPIE. 6794, ICMIT 2007: Mechatronics, MEMS, and Smart Materials
KEYWORDS: Image processing algorithms and systems, Edge detection, Wavelet transforms, Digital image processing, Image segmentation, Image processing, Wavelets, Interference (communication), Linear filtering, Image filtering

Showing 5 of 10 publications
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