Dr. Hongyan H. Shang
Instructor at Shanghai Maritime Univ
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | October 13, 2008
Proc. SPIE. 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration
KEYWORDS: Electron beams, X-rays, Silicon, Distortion, 3D modeling, Finite element methods, Photomasks, Heat flux, Semiconducting wafers, X-ray lithography

PROCEEDINGS ARTICLE | October 10, 2008
Proc. SPIE. 7129, Seventh International Symposium on Instrumentation and Control Technology: Optoelectronic Technology and Instruments, Control Theory and Automation, and Space Exploration
KEYWORDS: Mathematical modeling, Light sources, Sensors, Electrodes, Error analysis, Computer simulations, Time metrology, Thulium, Technetium, Light

PROCEEDINGS ARTICLE | November 6, 2006
Proc. SPIE. 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
KEYWORDS: Mathematical modeling, Superposition, Gaussian beams, Sensors, Error analysis, Laser development, Distortion, Optical simulations, Charge-coupled devices, Astronomical engineering

PROCEEDINGS ARTICLE | November 6, 2006
Proc. SPIE. 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
KEYWORDS: Gold, X-rays, Distortion, 3D modeling, Finite element methods, Photomasks, X-ray technology, Thermal modeling, Temperature metrology, Absorption

PROCEEDINGS ARTICLE | October 28, 2006
Proc. SPIE. 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation
KEYWORDS: Mathematical modeling, Light sources, Sensors, Electrodes, Resistance, Capacitance, Mathematics, Automatic control, Information operations, Light

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