Dr. Hoon Jeong
at Korea Institute of Industrial Technology
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | March 14, 2018
Proc. SPIE. 10511, Solid State Lasers XXVII: Technology and Devices
KEYWORDS: Second-harmonic generation, Femtosecond phenomena, Laser therapeutics, Laser vision correction, High power lasers, Crystals, Ytterbium, Laser crystals, Harmonic generation, Nonlinear crystals

PROCEEDINGS ARTICLE | October 19, 2006
Proc. SPIE. 6374, Optomechatronic Actuators, Manipulation, and Systems Control
KEYWORDS: Optical fibers, Ferroelectric materials, Cameras, Signal attenuation, Electrodes, Single mode fibers, Numerical analysis, Optical communications, Optical alignment, Variable optical attenuators

PROCEEDINGS ARTICLE | October 19, 2006
Proc. SPIE. 6374, Optomechatronic Actuators, Manipulation, and Systems Control
KEYWORDS: Waveguides, Cladding, Surface roughness, Optical fabrication, Optical communications, Optical simulations, Polymer optical fibers, Sol-gels, Beam propagation method, Phase only filters

PROCEEDINGS ARTICLE | December 5, 2005
Proc. SPIE. 6048, Optomechatronic Actuators and Manipulation
KEYWORDS: Refractive index, Ferroelectric materials, Cladding, Signal attenuation, Electrodes, Ceramics, Single mode fibers, Numerical analysis, Telecommunications, Variable optical attenuators

PROCEEDINGS ARTICLE | December 5, 2005
Proc. SPIE. 6048, Optomechatronic Actuators and Manipulation
KEYWORDS: Digital signal processing, Microfluidics, Patents, Particles, Magnetism, Power supplies, Finite element methods, Velocity measurements, Electromagnetism, Fluid dynamics

PROCEEDINGS ARTICLE | December 5, 2005
Proc. SPIE. 6048, Optomechatronic Actuators and Manipulation
KEYWORDS: Packaging, Manufacturing, Scanning electron microscopy, Head, Information technology, Manufacturing equipment, Semiconducting wafers, Optics manufacturing, Wafer bonding, Temperature metrology

Showing 5 of 7 publications
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