Dr. Hoon Kim
at National Univ of Singapore
SPIE Involvement:
Conference Program Committee | Author
Publications (7)

Proceedings Article | 5 March 2013
Proc. SPIE. 8642, Emerging Liquid Crystal Technologies VIII
KEYWORDS: Polymers, Liquid crystals, Ultraviolet radiation, Transmittance, Molecules, LCDs, Electrodes, Distortion, Switching, Electro optics

Proceedings Article | 20 March 2010
Proc. SPIE. 7636, Extreme Ultraviolet (EUV) Lithography
KEYWORDS: Photomasks, Extreme ultraviolet lithography, Semiconducting wafers, Extreme ultraviolet, Lithography, Inspection, Line width roughness, Scanners, Critical dimension metrology, Electroluminescence

Proceedings Article | 18 March 2009
Proc. SPIE. 7271, Alternative Lithographic Technologies
KEYWORDS: Photomasks, Extreme ultraviolet lithography, Nanoimprint lithography, Silicon, Semiconducting wafers, Ruthenium, Extreme ultraviolet, Reflectivity, Phase shifts, Refractive index

Proceedings Article | 27 March 2008
Proc. SPIE. 6921, Emerging Lithographic Technologies XII
KEYWORDS: Photomasks, Carbon, Contamination, Ruthenium, Extreme ultraviolet lithography, Silicon, Critical dimension metrology, Reflectivity, Extreme ultraviolet, Semiconducting wafers

Proceedings Article | 3 October 2006
Proc. SPIE. 6353, Optical Transmission, Switching, and Subsystems IV
KEYWORDS: Transmitters, Tolerancing, Modulators, Receivers, Eye, Dispersion, Signal generators, Binary data, Optical filters, Optical amplifiers

Showing 5 of 7 publications
Conference Committee Involvement (2)
Optical Transmission, Switching, and Subsystems
2 November 2007 | Wuhan, China
Optical Transmission, Switching, and Subsystems III
7 November 2005 | Shanghai, China
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