Dr. Hossein Lotfi
Characterization Engineer at
SPIE Involvement:
Author
Publications (8)

SPIE Journal Paper | September 5, 2017
OE Vol. 57 Issue 01
KEYWORDS: Semiconducting wafers, Sensors, Infrared photography, Infrared radiation, Photodetectors, Mid-IR, Superlattices, Diffusion, Doping, Gallium antimonide

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10111, Quantum Sensing and Nano Electronics and Photonics XIV
KEYWORDS: Infrared imaging, Mid-IR, Photodetectors, Continuous wave operation, Sensors, Quantum cascade lasers, Photonics systems, Infrared lasers, Optical instrument design, Infrared ROIC

PROCEEDINGS ARTICLE | January 27, 2017
Proc. SPIE. 10111, Quantum Sensing and Nano Electronics and Photonics XIV
KEYWORDS: Long wavelength infrared, Mid-IR, Photodetectors, Quantum wells, Sensors, Diffusion, Resistance, Infrared radiation, Infrared photography, Semiconducting wafers

PROCEEDINGS ARTICLE | May 20, 2016
Proc. SPIE. 9819, Infrared Technology and Applications XLII
KEYWORDS: Mid-IR, Short wave infrared radiation, Photodetectors, Sensors, Diffusion, Resistance, Infrared radiation, Infrared photography, Stereolithography, Temperature metrology

SPIE Journal Paper | June 11, 2015
OE Vol. 54 Issue 06
KEYWORDS: Sensors, Semiconducting wafers, Stereolithography, Photodetectors, Diffusion, Infrared radiation, Infrared photography, Electroluminescence, Temperature metrology, Gallium antimonide

PROCEEDINGS ARTICLE | February 8, 2015
Proc. SPIE. 9370, Quantum Sensing and Nanophotonic Devices XII
KEYWORDS: Long wavelength infrared, Photodetectors, Sensors, Diffusion, Electroluminescence, Infrared radiation, Infrared photography, Semiconducting wafers, Stereolithography, Temperature metrology

Showing 5 of 8 publications
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