Houping Wu
at National Institute of Metrology
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 12 December 2018
Proc. SPIE. 10845, Three-Dimensional Image Acquisition and Display Technology and Applications
KEYWORDS: Light sources, Reflection, Imaging systems, Cameras, Calibration, Image processing, Digital cameras, Bidirectional reflectance transmission function, Statistical modeling, RGB color model

Proceedings Article | 12 December 2018
Proc. SPIE. 10847, Optical Precision Manufacturing, Testing, and Applications
KEYWORDS: Photodetectors, Calibration, Spectroscopy, Mercury, Lamps, Fourier transforms, Laser stabilization, Transmittance, Radiation effects, Standards development

Proceedings Article | 8 October 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Light sources, Metrology, Reflection, Sensors, Reflectivity, Control systems, Computer programming, Bidirectional reflectance transmission function, Measurement devices, Infrared radiation

Proceedings Article | 8 October 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Visible radiation, Reflection, Sensors, Calibration, Reflectivity, Bidirectional reflectance transmission function, Measurement devices, Infrared radiation, Aluminum, Standards development

Proceedings Article | 18 September 2014
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Optical spheres, Sensors, Calibration, Satellites, Remote sensing, Coating, Lamps, Power supplies, Control systems, Integrating spheres

Showing 5 of 9 publications
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