Prof. Hsi-Chao Chen
Assistant Professor at National Yunlin Univ of Science and Technology
SPIE Involvement:
Author
Publications (31)

Proceedings Article | 20 September 2023 Paper
Hao-Wei Kao, Sheng-Bin Chen, Tan-Fu Liu, Yang-Chi Wang, Hsi-Chao Chen, Bo-Huei Liao, Sheng-De Wong
Proceedings Volume 12607, 126070I (2023) https://doi.org/10.1117/12.3005544
KEYWORDS: Coating stress, Refractive index, Multilayers, Bending stress, Shadows, Positron emission tomography, Oxygen, Film thickness, Antireflective coatings, Phase shifts

Proceedings Article | 20 September 2023 Paper
Ying-Sheng Lin, Ming-Hsien Yen, An-Hsiung Cheng, Wen-Wei Huang, Hsi-Chao Chen
Proceedings Volume 12606, 126060N (2023) https://doi.org/10.1117/12.3008341
KEYWORDS: Zinc oxide, Gold nanoparticles, Glucose, Electrodes, Sensors, Copper, Aluminum, Gold, Nanoparticles, Electroplating

Proceedings Article | 8 December 2022 Paper
Proceedings Volume 12480, 1248009 (2022) https://doi.org/10.1117/12.2660162
KEYWORDS: Finite element methods, Multilayers, Refractive index, Stress analysis, Zirconium dioxide, Thin films, Positron emission tomography, Oxygen, Transmittance, Phase shifts

Proceedings Article | 27 October 2021 Paper
Kun-Hong Chen, Sheng-Bin Chen, Hsi-Chao Chen, Guan Chen, Tsung Wu, Kuo Kai
Proceedings Volume 11927, 119270P (2021) https://doi.org/10.1117/12.2616275
KEYWORDS: Tantalum, Multilayers, Refractive index, Positron emission tomography, Oxygen, Silica, Ion beams, Antireflective coatings, Optical properties, Deflectometry

Proceedings Article | 27 October 2021 Paper
Tan-Fu Liu, Bo-Jun Guo, Chi-Yang Lai, Chu-Han Huang, Ri-Jun Li, Hsi-Chao Chen, Yu-Hung Yen
Proceedings Volume 11926, 119261B (2021) https://doi.org/10.1117/12.2616181
KEYWORDS: Oxygen, Sputter deposition, Transmittance, Vanadium, Thin film devices, Argon, Thin films, Polymethylmethacrylate, Lithium, Ions

Showing 5 of 31 publications
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