Dr. Hu Chen
at Sichuan Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 3 January 2020 Paper
Proc. SPIE. 11373, Eleventh International Conference on Graphics and Image Processing (ICGIP 2019)
KEYWORDS: Defect detection, Convolutional neural networks, Inspection, Computer vision technology, Neural networks, Convolution

Proceedings Article | 3 January 2020 Paper
Proc. SPIE. 11373, Eleventh International Conference on Graphics and Image Processing (ICGIP 2019)
KEYWORDS: Safety, Defect detection, Convolutional neural networks, Inspection, Image classification, Network architectures, Defect inspection

Proceedings Article | 19 September 2017 Presentation + Paper
Proc. SPIE. 10391, Developments in X-Ray Tomography XI
KEYWORDS: X-ray computed tomography, CT reconstruction, Image processing, Image restoration, Computer programming, Deconvolution, Computed tomography, Convolution, Reconstruction algorithms, Image denoising

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