Hua Tong
Ph.D. Candidate at Lehigh Univ
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 4 March 2011
Proc. SPIE. 7939, Gallium Nitride Materials and Devices VI
KEYWORDS: Thin films, Silica, Scattering, Metals, Gallium nitride, Sapphire, Indium gallium nitride, Thermoelectric materials, Vapor phase epitaxy, Temperature metrology

Proceedings Article | 21 February 2011
Proc. SPIE. 7933, Physics and Simulation of Optoelectronic Devices XIX
KEYWORDS: Semiconductors, Scattering, Crystals, Aluminum nitride, Phonons, Thermoelectric materials, Acoustics, Indium nitride, Thermal modeling, N-type semiconductors

Proceedings Article | 12 March 2010
Proc. SPIE. 7602, Gallium Nitride Materials and Devices V
KEYWORDS: Quantum wells, Light emitting diodes, Microlens array, Quantum efficiency, Gallium nitride, Sapphire, Microlens, Indium gallium nitride, Active optics, Internal quantum efficiency

Proceedings Article | 12 March 2010
Proc. SPIE. 7602, Gallium Nitride Materials and Devices V
KEYWORDS: Thin films, Multilayers, Metals, Ceramics, Diffusion, Amplifiers, Gallium nitride, Sapphire, Indium nitride, Thermal modeling

Proceedings Article | 26 February 2010
Proc. SPIE. 7597, Physics and Simulation of Optoelectronic Devices XVIII
KEYWORDS: Semiconductors, Visible radiation, Light emitting diodes, Chemical species, Crystals, Electrons, Physics, Semiconductor lasers, Gallium nitride, Optoelectronics

Proceedings Article | 24 February 2009
Proc. SPIE. 7211, Physics and Simulation of Optoelectronic Devices XVII
KEYWORDS: Semiconductors, Scattering, Crystals, Gallium nitride, Aluminum nitride, Phonons, Indium gallium nitride, Thermoelectric materials, Indium nitride, Temperature metrology

Showing 5 of 11 publications
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