Huadong Hao
at Zict
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Metrology, Data modeling, Clouds, 3D modeling, Distance measurement, 3D scanning, Electro optics

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