Huan Kan
at Semiconductor Manufacturing International Corp
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 20 March 2019
Proc. SPIE. 10962, Design-Process-Technology Co-optimization for Manufacturability XIII
KEYWORDS: Logic, Databases, Metals, Design for manufacturing, Image classification, Standards development, Library classification systems, Back end of line, Front end of line

Proceedings Article | 20 March 2018
Proc. SPIE. 10588, Design-Process-Technology Co-optimization for Manufacturability XII
KEYWORDS: Multilayers, Visualization, Manufacturing, Intellectual property

Proceedings Article | 20 March 2018
Proc. SPIE. 10588, Design-Process-Technology Co-optimization for Manufacturability XII
KEYWORDS: Databases, Manufacturing, Data processing, Failure analysis, Design for manufacturability

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