Dr. Hubertus Wabnitz
at European XFEL GmbH
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 21 June 2017 Presentation
Proc. SPIE. 10236, Damage to VUV, EUV, and X-ray Optics VI
KEYWORDS: Photons, Electrons, Materials processing, Physics, Raman spectroscopy, Analytical research, Free electron lasers, States of matter, Stanford Linear Collider, Lead

Proceedings Article | 19 May 2011 Paper
Proc. SPIE. 8077, Damage to VUV, EUV, and X-ray Optics III
KEYWORDS: Polymethylmethacrylate, Signal attenuation, X-rays, Laser ablation, Extreme ultraviolet, Laser damage threshold, X-ray lasers, Free electron lasers, Liquid crystal lasers, Lead

Proceedings Article | 18 May 2009 Paper
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Mirrors, Chemical species, Spectroscopy, Copper, Ions, Silicon, Emission spectroscopy, Aluminum, Free electron lasers, Plasma

Proceedings Article | 18 May 2009 Paper
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Multilayers, X-ray optics, Optical microscopy, Optical coatings, Reflectivity, Atomic force microscopy, Transmission electron microscopy, Extreme ultraviolet, Laser damage threshold, Free electron lasers

Proceedings Article | 18 May 2009 Paper
Proc. SPIE. 7361, Damage to VUV, EUV, and X-Ray Optics II
KEYWORDS: Gaussian beams, Polymethylmethacrylate, Signal attenuation, Chemical species, X-rays, Surface roughness, Atomic force microscopy, Laser ablation, Solids, X-ray lasers

Showing 5 of 10 publications
Proceedings Volume Editor (1)

SPIE Conference Volume | 3 May 2007

Conference Committee Involvement (1)
Damage to VUV, EUV & X-ray Optics
18 April 2007 | Prague, Czech Republic
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