Dr. Huddee J. Ho
at FortéBio Corp
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 1, 1998
Proc. SPIE. 3512, Materials and Device Characterization in Micromachining
KEYWORDS: Contamination, Capillaries, Glasses, Molecules, Energy transfer, Coating, Image resolution, Nondestructive evaluation, Atomic force microscopy, Feedback signals

PROCEEDINGS ARTICLE | July 7, 1997
Proc. SPIE. 3050, Metrology, Inspection, and Process Control for Microlithography XI
KEYWORDS: Microscopes, Metrology, Microscopy, Electron microscopes, Atomic force microscopy, Scanning electron microscopy, Dimensional metrology, Photomicroscopy, Standards development, Scanning tunneling microscopy

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