Ms. Huei-Wen Yang
Engineer at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | July 1, 2003
Proc. SPIE. 4988, Advanced Optical Data Storage
KEYWORDS: Monochromatic aberrations, Eye, Reflection, Ultraviolet radiation, Nickel, Manufacturing, Reflectivity, Silicon films, Compact discs, Digital video discs

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