Dr. Hughes Giovannini
Professor at Institut Fresnel
SPIE Involvement:
Conference Program Committee | Author
Publications (18)

PROCEEDINGS ARTICLE | November 21, 2017
Proc. SPIE. 10569, International Conference on Space Optics — ICSO 2000
KEYWORDS: Ellipsometry, Scattering, Glasses, Interfaces, Light scattering, Polarimetry, Optical testing, Scatter measurement, Electromagnetic theory, Electromagnetic scattering

PROCEEDINGS ARTICLE | March 24, 2006
Proc. SPIE. 6152, Metrology, Inspection, and Process Control for Microlithography XX
KEYWORDS: Diffraction, Silica, Polarization, Sensors, Glasses, Silicon, Scatterometry, Profiling, Aluminum, Scatter measurement

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5462, Biophotonics Micro- and Nano-Imaging
KEYWORDS: Confocal microscopy, Microscopes, Mirrors, Coherence (optics), Interferometers, Sensors, Interferometry, Oxygen, Head, Objectives

PROCEEDINGS ARTICLE | February 25, 2004
Proc. SPIE. 5250, Advances in Optical Thin Films
KEYWORDS: Oxides, Optical design, Antireflective coatings, Etching, Silicon, Coating, Reflectivity, Photoresist materials, Infrared radiation, Anisotropic etching

PROCEEDINGS ARTICLE | November 19, 2003
Proc. SPIE. 4829, 19th Congress of the International Commission for Optics: Optics for the Quality of Life
KEYWORDS: Microscopes, Optical microscopes, Detection and tracking algorithms, Lenses, Sensors, Optical microscopy, Interferometry, Objectives, Electromagnetism, Near field optics

PROCEEDINGS ARTICLE | September 7, 1999
Proc. SPIE. 3738, Advances in Optical Interference Coatings
KEYWORDS: Refractive index, Antireflective coatings, Polarization, Reflection, Scattering, Interfaces, Light scattering, Coating, Atomic force microscopy, Absorption

Showing 5 of 18 publications
Conference Committee Involvement (1)
Optical Complex Systems: OCS11
5 September 2011 | Marseille, France
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