Dr. Hughes Giovannini Profile

Dr. Hughes Giovannini

Professor at Institut Fresnel

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Author

Publications (19)

Proceedings Article | 3 April 2018 Open Access

Broad-band absorbers for reduction of parasitic light: two alternative solutions

Hughes Giovannini, F. Lemarquis, H. Akhouayri, Michel Cathelinaud, Philippe Torchio, C. Amra, Bernard Cousin, D. Laubier, Georges Otrio

Proceedings Volume 10570, 1057022 (2018) https://doi.org/10.1117/12.2326628

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Proceedings Article | 21 November 2017 Open Access

Angular scattering and ellipsometry of the scattered field: multiscale roughness and contamination of surfaces

Carole Deumié, Nathalie Destouches, Hughes Giovannini, Claude Amra

Proceedings Volume 10569, 105691C (2017) https://doi.org/10.1117/12.2307934

KEYWORDS: Scattering, Light scattering, Polarimetry, Scatter measurement, Interfaces, Optical testing, Electromagnetic theory, Ellipsometry, Electromagnetic scattering, Glasses

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Proceedings Article | 24 March 2006 Paper

Spectroscopic polarized scatterometry applied to single-line profiling

Jean-Louis Stehlé, Jean-Philippe Piel, Jose Campillo, Dorian Zahorski, Hugues Giovannini

Proceedings Volume 6152, 61522Z (2006) https://doi.org/10.1117/12.657431

KEYWORDS: Diffraction, Polarization, Silica, Aluminum, Scatterometry, Glasses, Scatter measurement, Sensors, Silicon, Profiling

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Proceedings Article | 10 September 2004 Paper

Axial localization of luminophores by partial coherence interferometry

Nicolas Sandeau, Herve Rigneault, Pierre-Francois Lenne, Hugues Giovannini

Proceedings Volume 5462, (2004) https://doi.org/10.1117/12.545661

KEYWORDS: Microscopes, Objectives, Interferometry, Interferometers, Confocal microscopy, Mirrors, Sensors, Head, Oxygen, Coherence (optics)

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Proceedings Article | 25 February 2004 Paper

Design and fabrication of biperiodic AR gratings for the infrared

Ludovic Escoubas, Michele Loli, Jean-Jacques Simon, Hugues Giovannini, Francois Flory, Frederic Lemarquis, Stefan Enoch, Gerard Berginc

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.512709

KEYWORDS: Silicon, Reflectivity, Etching, Antireflective coatings, Optical design, Photoresist materials, Infrared radiation, Coating, Oxides, Anisotropic etching

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Proceedings Article | 19 November 2003 Paper

Optical imagery

Anne Sentenac, Kamal Belkebir, Hugues Giovannini

Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.523841

KEYWORDS: Objectives, Near field optics, Sensors, Microscopes, Interferometry, Electromagnetism, Lenses, Detection and tracking algorithms, Optical microscopes, Optical microscopy

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Proceedings Article | 7 September 1999 Paper

New interferometric method for the complete determination of the properties of the light field scattered by a rough surface

Michel Lequime, Nathalie Destouches, Hugues Giovannini

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360104

KEYWORDS: Scattering, Light scattering, Beam splitters, Bidirectional reflectance transmission function, Fourier transforms, Interferometry, Phase measurement, Speckle, Phase shift keying, Signal detection

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Proceedings Article | 7 September 1999 Paper

Polarimetric phase measurement for the detection of contaminants on optical surfaces

Carole Deumie, Nathalie Destouches, Hugues Giovannini, Claude Amra

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360107

KEYWORDS: Scattering, Polarimetry, Light scattering, Phase measurement, Multilayers, Ellipsometry, Thin films, Glasses, Interfaces, Contamination

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Proceedings Article | 7 September 1999 Paper

Scattering from overcoated rough structures: application to the reduction of scattering

Hugues Giovannini, Anne Sentenac, Claude Amra

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360103

KEYWORDS: Scattering, Coating, Light scattering, Interfaces, Reflection, Antireflective coatings, Refractive index, Absorption, Polarization, Atomic force microscopy

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Proceedings Article | 20 April 1998 Paper

Roughness-induced absorption, scattering ellipsometry, and multidielectric resonances for laser damage investigation

Claude Amra, Sophie Maure, Carole Deumie, Hugues Giovannini, Jean-Yves Natoli

Proceedings Volume 3244, (1998) https://doi.org/10.1117/12.306971

KEYWORDS: Absorption, Ellipsometry, Light scattering, Laser scattering, Scattering, Laser induced damage, Thin films, Multilayers

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Proceedings Article | 1 October 1997 Paper

Enhanced absorption in very rough overcoated black surfaces

Hugues Giovannini, Claude Amra

Proceedings Volume 3133, (1997) https://doi.org/10.1117/12.290185

KEYWORDS: Absorption, Scattering, Light scattering, Dielectrics, Thin films, Multilayers, Optical coatings, Antireflective coatings, Thin film coatings, Refractive index

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Proceedings Article | 1 October 1997 Paper

Interest of hybrid structures for thin-film design: multilayered subwavelength microgratings

F. Lemarchand, Hugues Giovannini, Anne Sentenac

Proceedings Volume 3133, (1997) https://doi.org/10.1117/12.290201

KEYWORDS: Optical filters, Multilayers, Coating, Optical filtering, Waveguides, Thin films, Dielectric filters, Modulation, Reflection, Wave propagation

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Proceedings Article | 1 October 1997 Paper

Mechanical properties of dielectric thin films

Herve Rigneault, Christine Mahodaux, Hugues Giovannini, Ludovic Escoubas, Paul Moretti

Proceedings Volume 3133, (1997) https://doi.org/10.1117/12.290191

KEYWORDS: Annealing, Thin films, Ions, Absorption, Multilayers, Xenon, Helium, Ion implantation, Plating, Tantalum

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Proceedings Article | 19 August 1996 Paper

White-light interferometry: new developments applied to high-accuracy optical measurements

Serge Huard, Hugues Giovannini

Proceedings Volume 2775, (1996) https://doi.org/10.1117/12.246740

KEYWORDS: Sensors, Interferometers, Multiplexing, Computer programming, Interferometry, Modulation, Coherence (optics), Demodulation, Fiber optics sensors, Optical testing

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Proceedings Article | 30 November 1994 Paper

Use of a grating interferometer for the demodulation of white-light interferometric sensors

Hassan Akhouayri, Hugues Giovannini, Serge Huard, Michel Lequime

Proceedings Volume 2341, (1994) https://doi.org/10.1117/12.195538

KEYWORDS: Sensors, Interferometry, Interferometers, Modulation, Demodulation, Beam splitters, Adaptive optics, Optical fibers, Signal detection, Light emitting diodes

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Proceedings Article | 15 November 1994 Paper

Temperature measurement with a tapered monomode fiber by coherence multiplexing

Denis Konan, Hugues Giovannini, Arnaud Symon, Xavier Daxhelet

Proceedings Volume 2248, (1994) https://doi.org/10.1117/12.194336

KEYWORDS: Sensors, Single mode fibers, Multiplexing, Phase measurement, Temperature metrology, Temperature sensors, Interferometers, Numerical simulations, Light emitting diodes, Fiber optics sensors

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Proceedings Article | 14 September 1994 Paper

Use of a grating interferometer as a parallel receiver for fibre optics white light quasi-distributed sensors

Hugues Giovannini, Hassan Akhouayri, Serge Huard, Jean-Jacques Guerin, Michel Lequime

Proceedings Volume 2360, (1994) https://doi.org/10.1117/12.185033

KEYWORDS: Sensors, Interferometers, Receivers, Fiber optics, Optical sensors, Composites, Interferometry, Detector arrays, Fiber optics sensors, Modulation

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Proceedings Article | 1 February 1991 Paper

Fiber optic magnetic field sensor using spectral modulation encoding

Michel Lequime, Carole Meunier, Hugues Giovannini

Proceedings Volume 1367, (1991) https://doi.org/10.1117/12.24749

KEYWORDS: Sensors, Magnetism, Magnetic sensors, Fiber optics, Modulation, Birefringence, Computer programming, Fiber optics sensors, Magneto-optics, Light emitting diodes

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Proceedings Article | 1 August 1990 Paper

Dual-wavelenth passive homodyne detection unit for fiber-coupled white-light interferometers

Michel Lequime, Catherine Lecot, Hugues Giovannini, Serge Huard

Proceedings Volume 1267, (1990) https://doi.org/10.1117/12.20316

KEYWORDS: Sensors, Fiber optics sensors, Modulation, Interferometers, Light emitting diodes, Homodyne detection, Prototyping, Visibility, Computer programming, Polarimetry

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Showing 5 of 19 publications

Conference Committee Involvement (1)

Optical Complex Systems: OCS11

5 September 2011 | Marseille, France

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