Hugo Larocque
at Univ of Ottawa
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 March 2019
Proc. SPIE. 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
KEYWORDS: Signal to noise ratio, Photon polarization, Polarization, Tissues, Opacity, Interferometers, Image processing, Single photon, Image quality, Photosensitive materials

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