Prof. Hui-Kang Teng
Professor at Nan Kai Univ of Technology
SPIE Involvement:
Author
Area of Expertise:
interferometric measurements
Publications (4)

Proceedings Article | 29 August 2009
Proc. SPIE. 7382, International Symposium on Photoelectronic Detection and Imaging 2009: Laser Sensing and Imaging
KEYWORDS: Signal to noise ratio, Mirrors, Beam splitters, Oscillators, Polarization, Interferometers, Interference (communication), Heterodyning, Signal detection, Plasma display panels

Proceedings Article | 17 January 2008
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Ferroelectric materials, Modulation, Polarization, Interferometers, Interferometry, Phase shift keying, Heterodyning, Phase measurement, Laser beam diagnostics, Phase shifts

SPIE Journal Paper | 1 December 2005
OE Vol. 44 Issue 12
KEYWORDS: Polarization, Birefringence, Optical engineering, Optical components, Phase shifts, Wave plates, Error analysis, Diffraction, Interferometry, Optical testing

Proceedings Article | 14 February 2005
Proc. SPIE. 5634, Advanced Sensor Systems and Applications II
KEYWORDS: Optical components, Phase shifting, Polarization, Birefringence, Tissues, Interferometers, Interferometry, Wave plates, Optical testing, Phase shifts

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