Hui Lin
at Xi'an Institute of Optics and Precision Mechanics
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 November 2012 Paper
Hui Lin, Xinfeng Tian, Xiuqin Su
Proceedings Volume 8558, 85582J (2012) https://doi.org/10.1117/12.2001100
KEYWORDS: Charge-coupled devices, Interference (communication), 3D modeling, Denoising, Near field optics, Imaging systems, Error analysis, Near field, Image processing, Signal processing

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