Hui Lin
at Xi'an Institute of Optics and Precision Mechanics
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 November 2012
Proc. SPIE. 8558, Optoelectronic Imaging and Multimedia Technology II
KEYWORDS: Charge-coupled devices, Interference (communication), 3D modeling, Denoising, Near field optics, Imaging systems, Error analysis, Near field, Image processing, Signal processing

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