Huichan H. Liu
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 November 2007 Paper
Huichan Liu, Guojin He
Proceedings Volume 6790, 67900F (2007) https://doi.org/10.1117/12.741769
KEYWORDS: Wavelets, Remote sensing, Image retrieval, Feature extraction, Image resolution, Statistical analysis, Solids, Databases, Visual process modeling, Statistical methods

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