Prof. Huimin Xie Profile

Prof. Huimin Xie

Professor at Tsinghua Univ

SPIE Involvement:

Conference Program Committee | Conference Chair | Author

Publications (19)

PROCEEDINGS ARTICLE | July 24, 2018

Determination of the moiré spacing in sampling moiré method based on the generation mechanism of sampling moiré

Proc. SPIE. 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)

KEYWORDS: Phase shifting, Analytical research, Experimental mechanics

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PROCEEDINGS ARTICLE | June 13, 2017

Nondestructive identification of defects in additive manufacturing (AM) structures using continuous phase-shifted coherent gradient sensing method

Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering

KEYWORDS: Inspection, Reflectivity, Nondestructive evaluation, 3D printing, Additive manufacturing, Printing, Turbulence, Optical resolution, Spatial resolution, 3D scanning

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SPIE Journal Paper | May 17, 2017

Methodology for microscale deformation measurement of free-standing thin films

Wu, Dan , Xie, Huimin , Wang, Rong

OE Vol. 56 Issue 05

KEYWORDS: Thin films, Fabrication, Ion beams, Etching, Scanning electron microscopy, Microscopes

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PROCEEDINGS ARTICLE | June 22, 2015

Modified coherent gradient sensing method for slope measurement of reflective surfaces

Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX

KEYWORDS: Thin films, Fringe analysis, Phase shifting, Reflection, Error analysis, Ions, Reflectivity, Interferometry, Numerical analysis, Mechanical sensors

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SPIE Journal Paper | April 9, 2015

Reconstruction of planar periodic structures based on Fourier analysis of moiré patterns

Zhu, Ronghua , Xie, Huimin , Tang, Minjin , Li, Chuanwei , Wu, Dan

OE Vol. 54 Issue 04

KEYWORDS: Scanning electron microscopy, Raster graphics, Fringe analysis, Calibration, Microscopes, Optical engineering, Superposition, Fourier transforms, Silicon, Image processing

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PROCEEDINGS ARTICLE | November 13, 2014

High-frequency deformation grating fabrication techniques and applications

Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III

KEYWORDS: Fabrication, Lithography, Microscopes, Electron beam lithography, Electron beams, Holography, Optical lithography, Metals, Deflectometry, Nanoimprint lithography

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SPIE Journal Paper | November 18, 2013

High-accuracy magnification calibration for a microscope based on an improved discrete Fourier transform

Dai, Xianglu , Xie, Huimin , Li, Chuanwei , Wu, Zhu , Geng, Hongxia

OE Vol. 52 Issue 11

KEYWORDS: Calibration, Microscopes, Fourier transforms, Scanning electron microscopy, Image processing, Optical engineering, Mechanics, Electron microscopes, Optical microscopes, Chemical species

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PROCEEDINGS ARTICLE | August 25, 2009

Elastic constant and fracture toughness measurement of bamboo charcoal using digital speckle correlation method

Proc. SPIE. 7375, ICEM 2008: International Conference on Experimental Mechanics 2008

KEYWORDS: Atrial fibrillation, Mechanics, Imaging systems, Speckle, Image processing, Manufacturing, Digital image correlation, Silicon carbide, Experimental mechanics, Correlation function

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SPIE Conference Volume | August 20, 2009

ICEM 2008: International Conference on Experimental Mechanics 2008

SPIE Journal Paper | March 1, 2007

Full-field strain measurement using a two-dimensional Savitzky-Golay digital differentiator in digital image correlation

Pan, Bing , Xie, Huimin , Guo, Zhiqing , Hua, Tao

OE Vol. 46 Issue 03

KEYWORDS: Seaborgium, Digital image correlation, Optical engineering, Correlation function, Digital filtering, Optical filters, Finite element methods, Mechanics, Filtering (signal processing), Speckle

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PROCEEDINGS ARTICLE | April 27, 2006

Fabrication technique of nanograting using AFM

Proc. SPIE. 6188, Optical Micro- and Nanometrology in Microsystems Technology

KEYWORDS: Fabrication, Nanotechnology, Phase shifting, Aerospace engineering, Mechanics, Silicon, Manufacturing, Atomic force microscopy, Atomic force microscope, Nanolithography

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PROCEEDINGS ARTICLE | April 12, 2005

Micro/nano grating and its application to moiré measurement

Proc. SPIE. 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics

KEYWORDS: Fabrication, Lithography, Metals, Crystals, Atomic force microscopy, Aluminum, Scanning probe microscopy, Molecular beam epitaxy, Nanolithography, Scanning tunneling microscopy

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PROCEEDINGS ARTICLE | April 12, 2005

Uncertainty principle and fringe image processing

Proc. SPIE. 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Image processing, Fourier transforms, Frequency modulation, Signal processing, Spatial resolution, Phase measurement, Signal detection

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PROCEEDINGS ARTICLE | April 12, 2005

Spatially sampling effect on fringe phase-shifting detection

Proc. SPIE. 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics

KEYWORDS: Signal to noise ratio, Fringe analysis, Modulation, Mechanics, Signal attenuation, Error analysis, Interference (communication), Quantization, Phase measurement, Phase shifts

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PROCEEDINGS ARTICLE | October 3, 2003

Micro/nano moire methods

Proc. SPIE. 5145, Microsystems Engineering: Metrology and Inspection III

KEYWORDS: Microelectromechanical systems, Moire patterns, Mica, Mechanics, Scanners, Crystals, Atomic force microscopy, Scanning electron microscopy, Electronic components, Spatial resolution

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