Huiru Yang
at Xiamen Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Spectrum analysis, Modulation, Fourier transforms, Phase shift keying, Optical testing, Data acquisition, Vibrometry, Signal processing, Electronics engineering, Bessel functions

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